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内容説明 The book reports modeling and simulation techniques for substrate noise coupling effects in RFICs and introduces isolation structures and design guides to mitigate such effects with the ultimate goal of enhancing the yield of RF and mixed signal SoCs. The book further reports silicon measurements， and new test and noise isolation structures. To the authors’ knowledge， this is the first title devoted to the topic of substrate noise coupling in RFICs as part of a large SoC.