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内容紹介 This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits， baseband filter linearization， and data conversion. These circuit-level techniques are described， with their relationships to emerging system-level calibration approaches， to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits， as demonstrated by test chip measurements. Describes a variety of variation-tolerant analog circuit design examples， including from RF front-ends， high-performance ADCs and baseband filters;Includes built-in testing techniques， linked to current industrial trends;Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.